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M27C1001-15F1
M27C1001-15F1

$3.69
M27C1001-15F1 Military/High-Rel:NTech.:CMOSNumber of Words:128kBits Per Word:8Maximum Access Time (S):150nOutput Config:3-StateNumber of Chip Selects:2Program Voltage (V):12.8Nom. Supp (V):5.0Maximum Operating Temp (C):70Package Style:DIPMounting Style:T# Pins:32TypicalDescription:Prog. Time=< 13Sec Nota Bene: Image is not true representation of part Nota Bene: Image is not true representation of part
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17)
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17)

$104.00
It seems to me it is just a summary of work done by others in
the ATE field over the years. The explanations of how a device
fault is detected are not clear in most of the cases presented
in the book. The book emphasizes too much on fault
modeling but not enough on test applications and techniques. Certainly not a good text book for students nor it
is a good book for ATE engineers. However, if you are looking
for some quick reference, this book is a good place to start
because it contains brief summaries of other people's work.

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